An integrated circuit wafer undergoing probe testing.
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Image Number: 4359-421Rights ManagedCredit Line:Michael Rosenfeld/Maximilian S/Maximilian Stock Ltd/Rosenfeld/SuperStockCollection:Maximilian Stock Ltd/Rosenfeld Story:High-Tech Molecular VisualizationsContributor:Michael Rosenfeld/Maximilian S Model Release:NoProperty Release:NoResolution:3739×5609











