A wafer of silicon etched with microprocessor integrated circuits. A quality control test circuit appears at lower right. The prismatic color patterns are produced by the inspection light as it is defracted by the microscopic circuit features. National Semiconductor Corporation (NSC), Silicon Valley, California, 1980.

$A wafer of silicon etched with microprocessor integrated circuits. A quality control test circuit appears at lower right. The prismatic color patterns are produced by the inspection light as it is defracted by the microscopic circuit features. National Semiconductor Corporation (NSC), Silicon Valley, California, 1980.$

SuperStock offers millions of photos, videos, and stock assets to creatives around the world. This image of A wafer of silicon etched with microprocessor integrated circuits. A quality control test circuit appears at lower right. The prismatic color patterns are produced by the inspection light as it is defracted by the microscopic circuit features. National Semiconductor Corporation (NSC), Silicon Valley, California, 1980. by Warren, William is available for licensing today.

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Warren, William

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